|Symposium on Materials Characterization using Advanced Electron Microscopy|
Institute for Advanced Materials, Devices, and Nanotechnology (IAMDN)
"A gathering to discuss materials characterization using advanced electron microscopy, including Aberration Correction instrumentation, High Angle Annular Dark Field (HAADF) Imaging, Electron Energy Loss Spectroscopy (EELS), and Energy Dispersed X-ray (EDX) characterization, to address materials characterization important to catalysis, complex materials, energy storage, and semi-conductors"
Confirmed Speakers: O. Krivanek (Nion), D. Muller (Cornell), P. Batson (Rutgers), F. Cosandey (Rutgers), Y. Horibe (Rutgers), C.H. Chen, (Taiwan U.), E. Stach (Brookhaven), Nan Yao (Princeton), C. Kiely (Lehigh).
In addition to invited speakers, there will be a limited number of contributed presentations selected from submitted abstracts. We will be offering a Student Prize of $150 for the best poster presentation.Read More
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